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JMP and YieldOptiX for Semiconductor Data Analysis

Unlock test and yield insights like never before

A three-day, hands-on course on JMP and YieldOptiX. Learn to analyze semiconductor test and yield data, speed up debug, and make better decisions. It prepares you to work as a certified yield analyst.

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Duration
3 days, 3 hours a day
Format
Theory plus guided labs
Delivery
In person or online
Language
English
Who it is for
  • Test engineers and technicians
  • Quality assurance staff in chip manufacturing
  • Product and yield engineers
  • New graduates moving into test and yield
  • Managers who want to read the data themselves
What you will learn
  • The fundamentals of STDF data and yield metrics
  • Core JMP features for test and yield exploration
  • Using Excel and JMP together
  • YieldOptiX to speed up debug, detect anomalies, and visualize yield
  • EasyLaunch for fast STDF loading
  • Failing bins, wafer exploration, and Pareto analysis
  • Machine learning features for deeper insight and automation
  • Clustering and ML for root cause
  • Automating screening, reporting, and limit simulation
Curriculum

What the course covers

Day 1 Fundamentals of yield and test data with JMP and STDF
  • STDF, datalogs, and the test stages (wafer sort, final test, system-level test)
  • JMP essentials: distributions, maps, and binning
  • Filtering, grouping, and drill-down
  • Building clear summary reports
Day 2 Rapid yield improvement with YieldOptiX
  • EasyLaunch and session management
  • Interactive wafer maps and bin distribution
  • Test Explorer and bin Pareto
  • Screen and Release for lot disposition
  • Global Test Limits control and limit simulation
  • Excel export with colors
Day 3 Advanced analytics and machine learning
  • Drift analysis across lots and time
  • Clustering to find hidden fail patterns
  • Decision trees and K-Nearest Neighbours for root cause
  • Real-time process window characterization
  • Automated multi-site reporting
  • A production-versus-returns case study
Who teaches it

Taught by working engineers

Led by a senior executive with sixteen years of experience in JMP, fab operations, semiconductor process technology, statistical data analysis, and quality improvement, including senior roles at leading semiconductor companies.

What you earn

A certificate that counts

Participants who complete the course and pass a short multiple-choice assessment receive the SilTest Certified Yield Analyst credential.

Questions

Good to know

Do I need a JMP license?

Yes. You can use the free JMP viewer or your company license. We help you get set up before the course.

Will we work on real data?

Yes, on demonstration or sanitized STDF data, so you practice on realistic cases without exposing anything confidential.

Do I need to program?

No. The work is visual and point-and-click. Optional scripting is shown for those who want it.

Can my whole team join?

Yes. Team and corporate rates are available. Contact us and we will arrange it.

Join this course

Register your interest and we will send you the next dates, the price, and everything you need.

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